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Méthode directe de correction des profils de raies de diffraction des rayons X. II. Influence de la fente réceptrice sur l'enregistrement d'un profil de raie de diffraction X
| Content Provider | Semantic Scholar |
|---|---|
| Author | Louër, Daniel Weigel, Dominique |
| Copyright Year | 1969 |
| Abstract | The numerical method of deconvolution described in part I is applied to a study of a broadening factor of the diffractometer: the receiving slit. By considering this factor the validity of this direct method of deconvolution, which can also be applied to analytical profiles and to experimental profiles, is verified. These results are compared with those obtained with the Stokes method for the Fourier analysis of line profiles and with those obtained with the Ergun method. An experimental study shows the importance of the divergence of parallelism between the receiving slit and the beam of X-rays. |
| Starting Page | 338 |
| Ending Page | 350 |
| Page Count | 13 |
| File Format | PDF HTM / HTML |
| DOI | 10.1107/S0567739469000556 |
| Volume Number | 25 |
| Alternate Webpage(s) | http://journals.iucr.org/a/issues/1969/02/00/a06467/a06467.pdf |
| Alternate Webpage(s) | https://doi.org/10.1107/S0567739469000556 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
