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Structural, photoluminescence and XPS properties of Tm3+ ions in ZnO nanostructures
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kabongo, Guy L. Mhlongo, Gugu H. Mothudi, Bakang Moses Hillie, K. T. Mbule, Pontsho Sylvia Dhlamini, Mokhotjwa Simon |
| Copyright Year | 2017 |
| Abstract | Abstract In the present study, a succession of thulium (Tm)-doped zinc oxide (ZnO) nanostructures samples were prepared by sol-gel method using zinc acetate dihydrate, thulium nitrate pentahydrate and sodium hydroxide species with absolute ethanol as solvent. The X-Ray diffraction (XRD) revealed phase purity (hexagonal Wurtzite structure) and high crystalline nature of both Tm 3+ doped and undoped ZnO samples. Furthermore, defects mediated levels in the samples were investigated by means of photoluminescence (PL) spectroscopy. Finally, Tm 4d core level was detected in ZnO: 0.5 mol% Tm 3+ sample from high resolution X-Ray Photoelectron Spectroscopy (XPS) scan. |
| Starting Page | 141 |
| Ending Page | 153 |
| Page Count | 13 |
| File Format | PDF HTM / HTML |
| DOI | 10.1016/j.jlumin.2017.02.024 |
| Volume Number | 187 |
| Alternate Webpage(s) | http://researchspace.csir.co.za/dspace/bitstream/handle/10204/10021/Kabongo_20152_2017.pdf?isAllowed=y&sequence=1 |
| Alternate Webpage(s) | https://doi.org/10.1016/j.jlumin.2017.02.024 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |