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Semi‐quantitative temperature accelerated life test (ALT) for the reliability qualification of concentrator solar cells and cell on carriers
| Content Provider | Semantic Scholar |
|---|---|
| Author | Núñez, Neftalí Vázquez, Manuel Orlando, Vincenzo Espinet-González, Pilar Algora, Carlos |
| Copyright Year | 2015 |
| Abstract | An adequate qualification of concentrator photovoltaic solar cells and cell-on-carriers is essential to increase their industrial development. The lack of qualification tests for measuring their reliability together with the fact that conventional accelerated life tests are laborious and time consuming are open issues. Accordingly, in this paper, we propose a semi-quantitative temperature-accelerated life test to qualify solar cells and cell-on-carriers that can assure a minimum life when failure mechanisms are accelerated by temperature under emulated nominal working conditions with an activation energy >0.9 eV. A properly designed semi-quantitative accelerated life test should be able to determine if the device under test will satisfy its reliability requirements with an acceptable uncertainty level. The applicability, procedure, and design of the proposed test are detailed in the paper. |
| Starting Page | 1857 |
| Ending Page | 1866 |
| Page Count | 10 |
| File Format | PDF HTM / HTML |
| DOI | 10.1002/pip.2631 |
| Volume Number | 23 |
| Alternate Webpage(s) | http://oa.upm.es/40422/1/INVE_MEM_2015_221165.pdf |
| Alternate Webpage(s) | https://doi.org/10.1002/pip.2631 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
