Loading...
Please wait, while we are loading the content...
Optical Characterization of Anisotropic Thiophene-Phenylene Co-Oligomer Micro Crystals by Spectroscopic Imaging Ellipsometry
| Content Provider | Semantic Scholar |
|---|---|
| Author | Röling, Christian Poimanova, Elena Yu. Bruevich, Vladimir V. |
| Copyright Year | 2017 |
| Abstract | Here we demonstrate Imaging Ellipsometry as a combination of microscopy and ellipsometry to characterize even micro-sized thin film crystals on plane surface regarding anisotropy, optical properties, crystalline domains and thickness. The semiconducting thiophene phenylene co-oligomer 1,4-bis(5’-hexyl-[2,2’-bithiophen]5-yl)benzene (dHex-TTPTT) crystals were grown by solvent based self-assembly technique on silicon substrate with 300 nm thermally-grown silicon dioxide (Fig. 1). |
| File Format | PDF HTM / HTML |
| Volume Number | 4 |
| Alternate Webpage(s) | https://www.tu-chemnitz.de/physik/WSE10/abstracts/Poster/Abstract_Thiesen-3_20171215.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
