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Standardization of excitation efficiency in near-field scanning optical microscopy.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Mitsui, Tadashi Imanaka, Yasutaka Takehana, Kanji Takamasu, Tadashi Nakajima, Ken Kim, Jeongyong |
| Copyright Year | 2011 |
| Abstract | Near-field scanning optical microscope (NSOM or SNOM) is a form of scanning probe microscope (SPM), which is used to observe the optical properties of a sample surface with a nanometer-scale spatial resolution. Since the near-field light strongly interacts with the sample surface, or with nanometer-scale objects on the substrate's surface, NSOM is advantageous to excite only the vicinity of a sample surface. From the view point of surface chemical analysis, a discussion about the light energy concentration within a nanometer-scale region, and an estimation of its efficiency are indispensable for accurate measurements of the optical properties in a nanometer-scale region. In this paper, we describe the concept, the cautions and the general guidelines of a method to measure the excitation efficiency of aperture-type NSOM instruments. |
| Starting Page | 454 |
| Ending Page | 463 |
| Page Count | 10 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://www.jstage.jst.go.jp/article/analsci/27/2/27_2_139/_pdf |
| PubMed reference number | 21321434v1 |
| Volume Number | 27 |
| Issue Number | 2 |
| Journal | Analytical sciences : the international journal of the Japan Society for Analytical Chemistry |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Excitation Instrument - device Microscope Device Component Nanometer Physical object Scanning Probe Microscopes (device) |
| Content Type | Text |
| Resource Type | Article |
