NDLI: Typhon : Multiplexed TEM Sample Preparation

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Typhon : Multiplexed TEM Sample Preparation

Content Provider	Semantic Scholar
Author	Mulligan, Sean Jain, Tilak Duggan, Erika G. Liu, Er Speir, Jeffrey A. Cheng, Anchi Nolan, John Carragher, Bridget Potter, Clinton S.
Copyright Year	2014
Abstract	Over the last decade there has been significant progress in the synthesis of inorganic and hybrid inorganic-organic nanoparticles in solution. Optimizing the synthesis conditions is often dependent on structural characterization of the nanoparticles. Transmission Electron Microscopy (TEM) provides a method for structural characterization that provides both high-resolution details of individual particles as well as particle size distribution and morphology. The draw back to this method has been that specimen preparation is typically very low-throughput; single specimens are prepared on individual TEM grids and then imaged one at a time. Imaging several tens to hundreds of nanoparticle synthesis conditions thus requires an equal number of TEM grids, which is cumbersome, time consuming, and not feasible as a routine characterization method.
File Format	PDF HTM / HTML
Alternate Webpage(s)	https://www.cambridge.org/core/services/aop-cambridge-core/content/view/44E409EBC47385323394F7B3C6EF705A/S1431927614007521a.pdf/typhon-multiplexed-tem-sample-preparation.pdf
Alternate Webpage(s)	http://journals.cambridge.org/fulltext_content/supplementary/MAM20_S3/assets/7337/1158.pdf
Language	English
Access Restriction	Open
Subject Keyword	Artificial nanoparticles Biological specimen CDISC SEND Biospecimens Terminology Geodesic grid Image resolution Mathematical morphology Multiplexing Optimizing compiler Throughput Transcutaneous Electric Nerve Stimulation Transmission Electron Microscopy
Content Type	Text
Resource Type	Article

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