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Sensitivity increase for coating thickness determination using THz waveguides.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Theuer, Michael Beigang, Rene Grischkowsky, D. |
| Copyright Year | 2010 |
| Abstract | We report on layer thickness determination down to a thickness of 2.5 microns using terahertz waveguide spectroscopy. Compared to typical single-pass transmission measurements in the time domain, the effective THz pulse delay is considerably increased for a given layer thickness by using the high filling factor of the THz waveguide. This corresponds to a sensitivity increase up to a factor of 50 for the measured delay, allowing the direct measurement of layer thicknesses down to below hundredths of a THz wavelength. |
| File Format | PDF HTM / HTML |
| PubMed reference number | 20589006 |
| Journal | Medline |
| Volume Number | 18 |
| Issue Number | 11 |
| Alternate Webpage(s) | https://utol.okstate.edu/sites/default/files/publications/pubs/170_paper-156.pdf |
| Alternate Webpage(s) | https://www.physik.uni-kl.de/fileadmin/beigang/PDF_zum_download/Theuer2010b.pdf |
| Alternate Webpage(s) | https://doi.org/10.1364/OE.18.011456 |
| Journal | Optics express |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |