NDLI: Superresolution by localization of quantum dots using blinking statistics.

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Superresolution by localization of quantum dots using blinking statistics.

Content Provider	Semantic Scholar
Author	Lidke, Keith A. Rieger, Bernd Jovin, Thomas M. Heintzmann, R.
Copyright Year	2005
Abstract	In microscopy, single fluorescence point sources can be localized with a precision several times greater than the resolution limit of the microscope. We show that the intermittent fluorescence or 'blinking' of quantum dots can analyzed by an Independent Component Analysis so as to identify the light emitted by each individual nanoparticle, localize it precisely, and thereby resolve groups of closely spaced (< lambda / 30) quantum dots. Both simulated and experimental data demonstrate that this technique is superior to localization based on Maximum Likelihood Estimation of the sum image under the assumption of point emitters. This technique has general application to any emitter with non-Gaussian temporal intensity distribution, including triplet state blinking. When applied to the labeling of structures, a high resolution "image" consisting of individually localized points may be reconstructed leading to the term "Pointillism".
Starting Page	671
Ending Page	671
Page Count	1
File Format	PDF HTM / HTML
Alternate Webpage(s)	http://www.researchgate.net/profile/Bernd_Rieger/publication/26268924_Superresolution_by_localization_of_quantum_dots_using_blinking_statistics._Opt_Express/links/09e41506f27b2cc3c5000000.pdf
Alternate Webpage(s)	https://pdfs.semanticscholar.org/d791/6f35cebcc5793f30f803f5aa106898960bf6.pdf
PubMed reference number	19498727v1
Volume Number	13
Issue Number	18
Journal	Optics express
Language	English
Access Restriction	Open
Subject Keyword	Blinking Emitter Device Component Fluorescence Iodine I 124-cRGDY-PEG-C Dots Microscope Device Component Normal Statistical Distribution
Content Type	Text
Resource Type	Article

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