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Direct tip-sample interaction force control for the dynamic mode atomic force microscopy
| Content Provider | Semantic Scholar |
|---|---|
| Author | Jeong, Younkoo Jayanth, G. R. Jhiang, Sissy M. Menq, Chia-Hsiang |
| Copyright Year | 2006 |
| Abstract | A control method, in which the tip-sample interaction force of each tapping cycle is directly regulated, is proposed for dynamic mode atomic force microscopy. It does not rely on the steady-state relationship between the cantilever’s oscillation amplitude and tip-to-sample distance, and therefore the cantilever’s transient dynamics and the time delay of rms-dc converter are irrelevant. Experimental results clearly demonstrate that the proposed method regulates the tip-sample interaction force for each tapping cycle and time delay effect is eliminated. Computer simulations also show that the proposed method reconstructs a step change in topography within two tapping cycles, independent of the cantilever’s transient dynamics. |
| Starting Page | 204102 |
| Ending Page | 204102 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.2203958 |
| Alternate Webpage(s) | http://www.s.kanazawa-u.ac.jp/phys/biophys/References/High-speed_AFM/Tip-sample-cntrol-APL-2006.pdf |
| Alternate Webpage(s) | http://biophys.w3.kanazawa-u.ac.jp/References/High-speed_AFM/Tip-sample-cntrol-APL-2006.pdf |
| Alternate Webpage(s) | https://doi.org/10.1063/1.2203958 |
| Volume Number | 88 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
