Loading...
Please wait, while we are loading the content...
Similar Documents
Layer-resolved magnetic structure of Fe / Cu ( 100 ) ultrathin films observed by the depth-resolved x-ray magnetic circular dichroism
| Content Provider | Semantic Scholar |
|---|---|
| Author | Amemiya, Kenta Kitagawa, Soichiro Matsumura, Daiju Abe, Hitoshi Hirokazu Watanabe Yokoyama, Toshihiko Ohta, Toshiaki |
| Copyright Year | 2003 |
| Abstract | Introduction The magnetic depth profile of 5-11 ML thick Fe/Cu(100) films is one of the most controversial issues in these decades. Qian et al.[1] indicated that the surface two layers are ferromagnetic, while inner layers are in the spin density wave (SDW) state with a wavenumber q=2π/2.7d. Their approach was still indirect, however, since they measured total magnetization changing the film thickness. Recently, we have developed a depthresolved x-ray circular magnetic dichroism (XMCD) technique, in which the probing depth is controlled by changing the detection angle for the emitted electrons[2]. It was necessary, however, to record the XMCD spectrum at each detection angle. In the present study, we have significantly improved this technique by using an imaging type detector, and applied it to the Fe/Cu(100) ultrathin films. Experimental In the depth-resolved XMCD measurements, the emitted electrons are separately collected at various detection angles, θd, by a system illustrated in Fig. 1. Therefore, a series of XMCD spectra with various probing depths are simultaneously recorded. All the experiments were performed at BL-7A in an ultrahigh vacuum chamber. Fe films were deposited on a clean and ordered Cu(100) single crystal and the film thickness was monitored by an in situ reflection highenergy electron diffraction observation. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://pfwww.kek.jp/acr2002pdf/part_b/pf02b270.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
