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METHOD FOR GENERATING TEST SIGNALS FOR AN INTEGRATED CIRCUIT AND TEST LOGIC UNIT BACKGROUND OF THE INVENTION Field of the Invention
| Content Provider | Semantic Scholar |
|---|---|
| Author | Tokar, Michael |
| Copyright Year | 2017 |
| Abstract | (54) METHOD FOR GENERATING TEST 5,517,455 A * 5/1996 McClure et al. .............. 326/38 SIGNALS FOR AN INTEGRATED CIRCUIT 6,032,282 A 2/2000 Masuda et al. ....... ... 714/738 AND TEST LOGIC UNIT 6,058,057 A * 5/2000 Ochiai et al. ............... 365/201 6,605.956 B2 * 8/2003 Farnworth et al. ............ 326/38 (75) Inventors: Volker Kilian, München (DE); Richard Roth, Unterhaching (DE) (73) Assignee: Infineon Technologies AG, Munich (DE) (*) Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 U.S.C. 154(b) by 49 days. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://patentimages.storage.googleapis.com/31/85/89/70537391b211fe/US6870392.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |