A Raman and scanning electron microscope analysis of magnetron sputtered thin-film carbon

Content Provider	Semantic Scholar
Author	Laumer, Jonathan
Copyright Year	2014
Abstract	Thin-film carbon coatings possess properties, such as extreme hardness, smoothness, and a nice glossy finish, that make them desirable for a variety of industrial and military applications. This thesis examines the Raman spectra associated with thin-films of carbon that are prepared using magnetron sputtering. The goal is to achieve a high amount of strong bonds, i.e., sp3 bonds, as in diamond, using this inexpensive and widely available deposition process. Raman spectroscopy is the chosen analytical method used for the purpose of this work, since it is non-destructive and widely available. Using Raman spectroscopy, an sp3 content of up to 77 % is determined. This suggests that it is possible to deposit thin-films of carbon that approach the properties of tetrahedral amorphous carbon, a material known for its excellent hardness and durability, using this inexpensive approach. A scanning electron microscope image of one of the thin-films of carbon is acquired and examined, conclusions regarding the transition between the underlaying titanium substrate and the thin-film of carbon being drawn. Further directions for possible research are mentioned.
File Format	PDF HTM / HTML
DOI	10.14288/1.0074399
Alternate Webpage(s)	https://open.library.ubc.ca/media/download/pdf/24/1.0074399/1
Alternate Webpage(s)	https://doi.org/10.14288/1.0074399
Language	English
Access Restriction	Open
Content Type	Text
Resource Type	Article