Loading...
Please wait, while we are loading the content...
Similar Documents
Soft-Mode Phonons in SrTiO 3 Thin Films Studied by Far-Infrared Ellipsometry and Raman Scattering
| Content Provider | Semantic Scholar |
|---|---|
| Author | Sirenko, Andrei Bernhard, Christian Golnik, Andrzej Akimov, I. A. Clark, Alison M. Hao, Jianhua |
| Copyright Year | 1999 |
| Abstract | We report the experimental studies of the vibrational spectra of SrTiO 3 films with the thickness of 1 µm grown by pulsed laser deposition. Fourier-transform infrared ellipsometry between 30 and 700 cm −1 and electric field-induced Raman scattering have been utilized for investigation of the phonon behavior. These results can be used for comparison with the low-frequency measurements of the static dielectric constant. In the films, the soft mode reveals hardening compared to that in bulk crystals. This observation is in agreement with the Lyddane-Sachs-Teller formalism. |
| File Format | PDF HTM / HTML |
| DOI | 10.1557/PROC-603-245 |
| Volume Number | 603 |
| Alternate Webpage(s) | https://web.njit.edu/~sirenko/Publications/Ch5-Papers-Talks/Old-Papers-before-NJIT/MRS-STO-1999.PDF |
| Alternate Webpage(s) | https://doi.org/10.1557/PROC-603-245 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |