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Nsls-ii Post Mortem Function Development and Data Analysis of Beam Dump *
| Content Provider | Semantic Scholar |
|---|---|
| Author | Wang, G.-M. Doom, Lewis Ha, Kiman Smith, Reid Q. Cheng, Weichang Choi, J. Tagger, Juri Tian, Yongchang Shaftan, Timur Madelon, Roger |
| Copyright Year | 2017 |
| Abstract | The National Synchrotron Light Source II (NSLS-II) is a state of the art 3 GeV third generation light source at Brookhaven National Laboratory. The storage ring was commissioned in 2014 and transitioned to routine operations in the December of the same year. At this point the facility hosts 16 operating beam lines with beam current upto 250 mA. During beamline operation, various sources (protection system or subsystem malfunction) may cause beam dump. To identify the beam trip sources and improve the operation reliability, post mortem function was developed in NSLS-II to capture the subsystems status and beam information prior and after beam dump, including RF system, power supply, BPMs and active interlock system. Most of the trip events have been identified and related source was improved. In this paper, we’ll present the post mortem function development and data application to diagnose beam dump source. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://accelconf.web.cern.ch/AccelConf/napac2016/papers/wepob66.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
