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A Process Mining Approach Based on Trace Alignment Information for Very Large Sequential Processes with Duplicated Activities
| Content Provider | Semantic Scholar |
|---|---|
| Author | Viale, Pamela Frydman, Claudia S. Pinaton, Jacques |
| Copyright Year | 2011 |
| Abstract | This paper presents an approach to construct models for very large sequential processes with duplicated activities. Very large meaning processes containing hundreds of activities. The algorithm uses traces of the process we are interested in modeling and construct an alignment between them. The alignment obtained is then used to guide the model construction. We present also the application of our approach to STMicroelectronics’ manufacturing processes. The constant modifications of semiconductor specifications forces engineers to continuously update processes. For this reason, STMicroelectronics is interested in re-constructing models of its manufacturing processes to being able to control their definitions and quickly react in case a problem is detected. |
| Starting Page | 442 |
| Ending Page | 451 |
| Page Count | 10 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.msc-les.org/proceedings/mas/2011/MAS2011_442.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |