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The extension of the NIST BRDF scale from 1100 nm to 2500 nm
| Content Provider | Semantic Scholar |
|---|---|
| Author | Yoon, Howard W. Allen, David W. Eppeldauer, George P. Tsai, Benjamin |
| Copyright Year | 2009 |
| Abstract | Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference Reflectometer (STARR) facility are described. The determination of bi-directional reflectance factor with low uncertainties requires the exInGaAs radiometer to be characterized for low-noise performance, linearity and spatial uniformity. The instrument characterizations will be used to establish a total uncertainty budget for the reflectance factor. To independently check the bi-directional reflectance factors, measurements also were made in a separate facility in which the reflectance factor is determined using calibrated spectral irradiance and radiance standards. The total combined uncertainties for the diffuse reflectances range from < 1 % at 1100 nm to 2.5 % at 2500 nm. At NIST, these measurement capabilities will evolve into a calibration service for diffuse spectral reflectance in this wavelength region. |
| File Format | PDF HTM / HTML |
| DOI | 10.1117/12.827293 |
| Alternate Webpage(s) | https://ws680.nist.gov/publication/get_pdf.cfm?pub_id=904078 |
| Alternate Webpage(s) | https://doi.org/10.1117/12.827293 |
| Volume Number | 7452 |
| Journal | Optical Engineering + Applications |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
