NDLI: Strain and grain connectivity in Bi2223/Ag superconducting tapes

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Strain and grain connectivity in Bi2223/Ag superconducting tapes

Content Provider	Semantic Scholar
Author	Huang, Ying Kai Haken, B. Ten Kate, H. H. J. Ten
Copyright Year	1999
Abstract	The critical current reduction in silver-sheathed (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10/ superconducting tapes (Bi2223/Ag) is investigated when loaded with uni-axial strains in combination with a magnetic field perpendicular to the tape surface. The number and quality of the grain-to-grain connections and the alignment of the superconducting cores mainly determine the critical current in Bi2223/Ag tapes. It is assumed that the transport current flows simultaneously through two current carrying paths in the tape: one through the network of Josephson junctions and the other is through the well-connected grains. The model describes well the magnetic field dependence of the critical current at various strains. A detailed analysis has shown that strain deteriorates grain connectivity, induces cracking and hence changes the current carrying path. Furthermore, strain may introduce new defects inside the grains along the strong-link current path and increase intra-granular pinning strength.
Starting Page	2702
Ending Page	2705
Page Count	4
File Format	PDF HTM / HTML
DOI	10.1109/77.785043
Volume Number	9
Alternate Webpage(s)	http://doc.utwente.nl/24027/1/Strain_grain_connectivity-huang.pdf
Alternate Webpage(s)	https://doi.org/10.1109/77.785043
Journal	IEEE Transactions on Applied Superconductivity
Language	English
Access Restriction	Open
Content Type	Text
Resource Type	Article

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