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N 93-13672 High Temperature Strain Gage Apparent Strain Compensation
| Content Provider | Semantic Scholar |
|---|---|
| Author | Holmes, Harlan K. Moore, Thomas C. |
| Abstract | Once an installed strain gage is connected to a strain indicating device and the instrument balanced, a subsequent change in temperature of the gage installation will generally produce a resistance change in the gage. This purely temperature-induced resistance change will be registered by the strain indicating device as strain and is referred to (in the U.S.) as apparent strain to distinguish it from strain in the test part due to applied stress. 1 Apparent strain is caused by two concurrent and algebraically additive effects in the strain gage installation. First, the electrical resistivity of the gage itself is temperature dependent and, secondly, differential thermal expansion between the gage and the substrate material upon which the gage is bonded creates an apparent mechanical strain. Mathematically, the electrical output of an initially balanced Wheatstone Bridge strain indicator is proportional to the strain experienced by the component resistive strain gages. The strain, as seen by any gage, can be expressed as follows: |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://ntrs.nasa.gov/archive/nasa/casi.ntrs.nasa.gov/19930004484.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
