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Compaction mechanism to reduce test pattern counts and segmented delay fault testing for path delay faults
| Content Provider | Semantic Scholar |
|---|---|
| Author | Jha, Sharada |
| Copyright Year | 2016 |
| Abstract | Approved: ____________________________________ Thesis Supervisor ____________________________________ Title and Department ____________________________________ Date COMPACTION MECHANISM TO REDUCE TEST PATTERN COUNTS AND SEGMENTED DELAY FAULT TESTING FOR PATH DELAY FAULTS |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://ir.uiowa.edu/cgi/viewcontent.cgi?article=4662&context=etd&httpsredir=1&referer= |
| Alternate Webpage(s) | http://ir.uiowa.edu/cgi/viewcontent.cgi?article=4662&context=etd |
| Alternate Webpage(s) | https://ir.uiowa.edu/cgi/viewcontent.cgi?article=4662&context=etd |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Data compaction Reduce Test card |
| Content Type | Text |
| Resource Type | Article |
