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Controlled Kinetic Monte Carlo Simulation of Nanomanufacturing Processes
| Content Provider | Semantic Scholar |
|---|---|
| Author | Wang, Yan |
| Copyright Year | 2011 |
| Abstract | Kinetic Monte Carlo (KMC) is regarded as an efficient tool for rare event simulation and has been used to simulate bottomup self-assembly processes of nanomanufacturing. Yet, it cannot simulate top-down processes. In this paper, we propose a new and generalized KMC mechanism, called controlled KMC or cKMC, to simulate complete physical and chemical processes. This generalization is enabled by the introduction of controlled events. In contrast to the traditional self-assembly events in KMC, controlled events occur at certain times, locations, or directions, which allows all events to be modeled. The applications of cKMC to several top-down and bottom-up processes are demonstrated. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://msse.gatech.edu/publication/cKMC_wang2010.pdf |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Bottom-up proteomics Extreme value theory Generalization (Psychology) Kinetic Monte Carlo Kinetics Monte Carlo method Self-assembly Simulation Top-down and bottom-up design |
| Content Type | Text |
| Resource Type | Article |
