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Comparison of Genetic and Random Techniques for Test Pattern Generation
| Content Provider | Semantic Scholar |
|---|---|
| Author | Ivask, Eero Raik, Jaan Ubar, Raimund |
| Copyright Year | 1998 |
| Abstract | * This work has been supported by the Estonian Science Foundation grant G-1850 ABSTRACT: Current paper presents a test pattern generation approach based on genetic algorithms. The algorithm is designed so that it allows direct comparison with random methods. Experimental results on ISCAS'85 benchmarks [6] show that the proposed algorithm performs significantly better than similar approach published in [1]. In addition, the test sets generated by the algorithm are more compact. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.pld.ttu.ee/~jaan/PDF/p029.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
