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Repetitive Short Circuit Behaviour of Trench-/field-stop Igbts
| Content Provider | Semantic Scholar |
|---|---|
| Author | Gutsmann, Bernd Kanschat, Peter Munzer, M. Pfaffenlehner, M. Laska, T. |
| Copyright Year | 2008 |
| Abstract | This paper has a focus on the short- circuit robustness of eupec modules with 1200V 3 rd generation IGBT chip from Infineon. Short-circuit failure modes are described and measures with regard to an optimised and robust chip structure are presented. Measurements of repetitive short-circuit pulses based on the Trench/Field-Stop IGBT 3 show that the typical number of short circuit pulses until destruction depends exponentially on the maximum chip temperature reached within the pulse. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.efo-power.ru/pub/power/IGBT/articles/statistika_otkaz_zam.pdf |
| Alternate Webpage(s) | https://www.infineon.com/dgdl/ed_pcim03_Repetitive_short.pdf?fileId=db3a304412b407950112b40ee6d112c1&folderId=db3a304412b407950112b408e8c90004&location=Products.Power_Modules.IGBT_Modules.DOCUMENTS.ed_pcim03_Repetitive_short.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |