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Reference Cantilevers for AFM Spring Constant Calibration
| Content Provider | Semantic Scholar |
|---|---|
| Author | Gates, Richard S. |
| Copyright Year | 2005 |
| Abstract | Atomic Force Microscopy Introduction: Atomic force microscopy (AFM) is widely used today to image surfaces and measure nanoscale forces. To accurately convert the AFM cantilever deflection to force, however, requires accurate spring constant calibration. Large variations in cantilever stiffness can occur even within a processing batch of cantilevers and without calibration, force conversion based on manufacturer’s nominal specifications can induce unacceptable errors. A reliable, accurate calibration method and associated artifact that can enable cantilever calibration is sorely needed. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://ws680.nist.gov/publication/get_pdf.cfm?pub_id=854292 |
| Alternate Webpage(s) | http://www.cnf.cornell.edu/doc/2005CNFra198.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |