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On the Non-scan BIST Schemes under Power Constraints for RTL Data Paths
| Content Provider | Semantic Scholar |
|---|---|
| Author | You, Zhiqiang Inoue, Michiko Fujiwara, Hideo |
| Copyright Year | 2003 |
| Abstract | This paper proposes three non-scan BIST schemes for RTL data paths and formulates DFT problems for the schemes under power constraints. The proposed schemes include one generic non-scan BIST scheme where we can explore trade-offs among hardware overhead, test application time and power dissipation. We also propose other two schemes, adjacent non-scan BIST scheme and boundary non-scan BIST scheme, as special cases that intend short test application time and low hardware overhead respectively. This paper also presents a power constrained test synthesis and scheduling algorithm for adjacent non-scan BIST scheme intended for short test application time. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://553b9da6-a-09b12d6c-s-sites.googlegroups.com/a/fujiwaralab.net/hideo/en/publication/C105_2003_11_WRTLT.pdf?attachauth=ANoY7cq7rJRiCybTw2nXeoSw6FkfIJk8NsiIGOm8KpmRwlTE2Wtc1aFE_s9_OdbatBjVYHNFPQXzxlg2xZqBF2S5s6Km9XlWBgoQElroilaoHZy1wVlG0_16WnKh_E5ghO-JLqFlqNJENBc6y8vVw1IO2_Qv7DUDK1LuibkgAsIHq0ikVAXGVSP80ZsdSuGu1vZCnTRwDYpXQbT3nl7L4xqqTwyTCIwqT7mwAYVrdb6CgQQI1OXFY4U%3D&attredirects=1 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
