Boundary-Scan Interconnect Test Vector Generation During VHDL Synthesis

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At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks (1999)

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At-speed boundary-scan interconnect testing in a board with multiple system clocks

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The driver/receiver conflict problem in interconnect testing with boundary-scan

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Interconnect testing of boards with partial boundary scan

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Improving bus test via IDDT and boundary scan

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BIST and interconnect testing with boundary scan

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A novel method for diagnosis of board level interconnect faults using boundary scan

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Study on boundary scan interconnect test of PCB based on genetic algorithm

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