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Charge state dependent energy deposition by ion impact.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Lake, Russell E. Pomeroy, Joshua M. Grube, Holger Sosolik, C. E. |
| Copyright Year | 2011 |
| Abstract | We report on a measurement of craters in thin dielectric films formed by Xe(Q+) (26 ≤ Q ≤ 44) projectiles. Tunnel junction devices with ion-irradiated barriers were used to amplify the effect of charge-dependent cratering through the exponential dependence of tunneling conductance on barrier thickness. Electrical conductance of a crater σ(c)(Q) increased by 4 orders of magnitude (7.9 × 10(-4) μS to 6.1 μS) as Q increased, corresponding to crater depths ranging from 2 to 11 Å. By employing a heated spike model, we determine that the energy required to produce the craters spans from 8 to 25 keV over the investigated charge states. Considering energy from preequilibrium nuclear and electronic stopping as well as neutralization, we find that at least (27 ± 2)% of available projectile neutralization energy is deposited into the thin film during impact. |
| Starting Page | 063202 |
| Ending Page | 063202 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.clemson.edu/ces/nanoscience/papers/PhysRevLett_107_063202.pdf |
| PubMed reference number | 21902321v1 |
| Volume Number | 107 |
| Issue Number | 6 |
| Journal | Physical review letters |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Ions Iontophoresis Kiloelectronvolt Neutralization (Chemistry) Transcutaneous Electric Nerve Stimulation exponential orders - HL7PublishingDomain |
| Content Type | Text |
| Resource Type | Article |
