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| Content Provider | Semantic Scholar |
|---|---|
| Author | Hsieh, Hsieh-Hung Huang, Yen-Chih Lu, Liang-Hung Huang, Guo-Wei |
| Copyright Year | 2007 |
| Abstract | A built-in self-test (BIST) architecture is proposed for voltage-controlled oscillators (VCO) operating at multi- gigahertz frequencies. By utilizing a frequency divider and a frequency-to-voltage converter (FVC), the output frequency and tuning range of the VCO can be extracted without external test instruments. The proposed BIST module is integrated with a wideband VCO as the DUT in a 0.18-µm CMOS process for demonstration. Within the tuning range of the VCO from 4.4 to 5.5 GHz, a frequency extraction error less than ±0.4% is achieved. The active area and the power consumption of the BIST module are 0.038 mm 2 and 11 mW, respectively. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.ece.ubc.ca/~vleung/accepted/IJWMC_sgv04.pdf |
| Alternate Webpage(s) | http://digilander.libero.it/sedekfx/papers_/tro2011.pdf |
| Alternate Webpage(s) | http://www.researchgate.net/profile/Ravinder_Dahiya2/publication/220032991_Tactile-Data_Classification_of_Contact_Materials_Using_Computational_Intelligence/links/0fcfd50ff8e91f0ca6000000.pdf |
| Alternate Webpage(s) | https://digilander.libero.it/sedekfx/papers_/tro2011.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
