Loading...
Please wait, while we are loading the content...
Similar Documents
Anisotropic Diffusion based Micro-crack Inspection in Polycrystalline Solar Wafers
| Content Provider | Semantic Scholar |
|---|---|
| Copyright Year | 2011 |
| Abstract | Abstract— Polycrystalline solar wafer consists of various crystals so the surface of solar wafer shows heterogeneous textures. Because of this property the visual inspection of micro-crack is very difficult. In this paper, we propose the anisotropic diffusion-based micro-crack detection scheme for polycrystalline solar wafers. In the proposed method, anisotropic diffusion is based on the application of diagonal-kernel and cross-kernel in parallel. Experimental results show that the proposed method has better performance of micro-crack detection than conventional anisotropic diffusion-based methods on a cross-kernel. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.iaeng.org/publication/IMECS2011/IMECS2011_pp524-528.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
