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On the Optimal Design of Failure Step-Stress Partially Accelerated Life Tests for Exponentiated Inverted Weibull with Censoring
| Content Provider | Semantic Scholar |
|---|---|
| Author | Hassan, A. S. |
| Copyright Year | 2013 |
| Abstract | This article deals with the optimal designing of failure stepstress partially accelerated life tests with two stress levels under type-I censoring.The lifetime of the test items is assumed to follow exponentiated inverted Weibull distribution. The point and interval estimates of the model parameters are obtained. Based on type I censoring, optimum test plans for failure step stress partially accelerated test are also developed through the D-optimality criterion. Such method minimizes the generalized asymptotic varianceof the maximum likelihood estimators for the model parameters. Some numerical illustrations are provided to illustrate the proposed procedure. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://ajbasweb.com/old/ajbas/2013/January/97-104.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
