Analytical Method for Thickness and Wrinkling Measurements of 2-D Zeolites

Content Provider	Semantic Scholar
Author	Kumar, P. Saidesh Agrawal, Kumar Varoon Tsapatsis, Michael Mkhoyan, K. Andre
Copyright Year	2015
Abstract	Two-dimensional (2-D) zeolites are near single-unit-cell thick layers of silicon and oxygen atoms with precisely-sized pores of molecular dimensions [1]. It is critical to determine the thickness and structure of 2-D zeolite layers in order to understand their unique transport [2] and catalytic properties [3]. Thickness measurements of 2-D zeolites are often performed by X-ray reflectivity experiments [4] or by imaging cross-sectional samples in a transmission electron microscope (TEM) [5]. However, X-ray reflectivity measurements require fabrication of a periodic multilayer, which is not feasible for zeolite nanosheets with sub-micron lateral dimensions. On the other hand, conventional TEM (CTEM) images of cross-sections require in-depth analysis of thickness and image contrast. Due to these limitations and the electron-beam-sensitive nature of 2-D zeolites [6], a method for unambiguous determination of their thickness and structure has remained elusive.
File Format	PDF HTM / HTML
Alternate Webpage(s)	http://diyhpl.us/~nmz787/M&M%202015/7337/2367.pdf
Language	English
Access Restriction	Open
Subject Keyword	Cross-sectional data Diagnostic radiologic examination Dimensions Experiment Lateral thinking Microscope Device Component Oxygen Silicon Thickness (graph theory) Transmission Electron Microscopes Transmission Electron Microscopy Zeolites anatomical layer electron microscope
Content Type	Text
Resource Type	Article