NDLI: In situ bending of an Au nanowire monitored by micro Laue diffraction

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In situ bending of an Au nanowire monitored by micro Laue diffraction

Content Provider	Semantic Scholar
Author	Leclere, Cédric Cornelius, Thomas Walter Ren, Zhe Davydok, Anton Micha, Jean-Sébastien Robach, Odile Richter, Gunther Belliard, Laurent Thomas, Olivier
Copyright Year	2015
Abstract	This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three-point bending on self-suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self-suspended wire, the evolution of µLaue diffraction patterns was monitored, allowing for extraction of the bending angle of the nanowire. This bending compares well with finite element analysis taking into account elastic constant bulk values and geometric nonlinearities. This novel experimental setup opens promising perspectives for studying mechanical properties at the nanoscale.
Starting Page	291
Ending Page	296
Page Count	6
File Format	PDF HTM / HTML
Alternate Webpage(s)	http://journals.iucr.org/j/issues/2015/01/00/nb5141/nb5141.pdf
Alternate Webpage(s)	http://ftp.ncbi.nlm.nih.gov/pub/pmc/9b/cd/j-48-00291.PMC4453168.pdf
Alternate Webpage(s)	https://hal.archives-ouvertes.fr/hal-01233798/document
PubMed reference number	26089751v1
Volume Number	48
Journal	Journal of applied crystallography
Language	English
Access Restriction	Open
Subject Keyword	APPL1 gene Bending - Changing basic body position Decompression Sickness Dislocations Gold Microscope Device Component Nanostructured Materials Nanowires Preparation Scanning Probe Microscopes (device) Spectrophotometry, Atomic Absorption orders - HL7PublishingDomain
Content Type	Text
Resource Type	Article

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