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Evolution of RESET current and filament morphology in low-power HfO2 unipolar resistive switching memory
| Content Provider | Semantic Scholar |
|---|---|
| Author | Hou, Tuo-Hung Lin, Kuan-Liang Shieh, Jiann Lin, Jun-Hung Chou, Cheng-Tung Lee, Yao-Jen |
| Copyright Year | 2011 |
| Abstract | Reduction in RESET current is crucial for future high-density resistive-switching memory. We have reported a unipolar-switching Ni/HfO2/Si structure with low RESET current of 50 μA and RESET power of 30 μW. In addition, a unique cycling evolution of RESET current across more than two orders of magnitude allows us to probe into the evolvement of filament morphology at nanoscale, using a simple yet quantitative model. Filament morphology was found to depend strongly on the charge-dissipation current proportional to the powers of SET voltage. Moreover, the formation of inactive semiconductive filaments plays an important role in the reduction in RESET current. |
| Starting Page | 103511 |
| Ending Page | 103511 |
| Page Count | 1 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.3565239 |
| Volume Number | 98 |
| Alternate Webpage(s) | http://cpanel-199-19.nctu.edu.tw/~thhou/publication/2011_APL_98_103511.pdf |
| Alternate Webpage(s) | https://doi.org/10.1063/1.3565239 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |