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Measurement and Characterization of FET Devices Using EKV Parameters Applied to POSFET Sensors
| Content Provider | Semantic Scholar |
|---|---|
| Author | Sinha, Arun Kumar |
| Copyright Year | 2013 |
| Abstract | This paper presents an algorithm to extract the EKV parameters using the input characteristic measurement. The working of the algorithm was verified by extracting a parameter through the pinch-off characteristic measurement. The extraction and measurement was performed on FET devices present in Piezo-Electric Oxide Semiconductor Field Effect Transistor (POSFET) sensor. Using the extracted parameters we fixed the region of operation of this sensor at weak inversion. |
| File Format | PDF HTM / HTML |
| DOI | 10.7763/ijiee.2013.v3.379 |
| Alternate Webpage(s) | http://ijiee.org/papers/379-E121.pdf |
| Alternate Webpage(s) | https://doi.org/10.7763/ijiee.2013.v3.379 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |