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Multilayer Laue Lenses for High Resolution X-ray Applications
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kubec, Adam Niese, Sven Gluch, Jürgen Rosenthal, Miranda Gawlitza, Peter Todt, Juraj Keckes, Jozef |
| Copyright Year | 2019 |
| Abstract | A. Kubec1,2, S. Niese3, J. Gluch4, M. Rosenthal5, P. Gawlitza1, J. Todt6 and J. Keckes6 1Fraunhofer Institute for Material and Beam Technology (IWS), Dresden, Germany 2now at: Paul Scherrer Institute (PSI), Villigen, Switzerland 3AXO DRESDEN GmbH, Applied X-ray Optics, Dresden, Germany 4Fraunhofer Institute for Ceramic Technologies and Systems (IKTS), Dresden, Germany 5European Synchrotron Radiation Facility (ESRF), Grenoble, France 6Montanuniversität Leoben, Leoben, Austria |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.dxcicdd.com/19/abstracts/icxom/I-65.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |