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Systemand Method for Detecting Integrated Circuit Anomalies Cross-reference to Related Applications
| Content Provider | Semantic Scholar |
|---|---|
| Copyright Year | 2017 |
| Abstract | (21) Appl. No.: 13/565,420 Circuitry, systems and methods for testing integrated circuits for the presence of anomalies. Techniques include applying a (22) Filed: Aug. 2, 2012 plurality of inputs to an integrated circuit under test to obtain a first plurality of measurements at least partially character Related U.S. Application Data izing power leakage in the integrated circuit under test, (60) Provisional application No. 61/514,627, filed on Aug. encode the first plurality of measurements, by computing a 3, 2011 sw1 s plurality of random linear combinations of measurements in s the first plurality of measurements, to obtain a second plural Publication Classification ity of encoded measurements determining whether the inte grated circuit under test contains at least one anomaly based, (51) Int. Cl. at least in part, on the second plurality of encoded measure GOIR 3L/26 (2006.01) mentS. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://patentimages.storage.googleapis.com/71/24/c5/42f9bd5ef964db/US20130204553A1.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
