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Interferometric characterization of a sub-wavelength near-infrared negative index metamaterial.
| Content Provider | Semantic Scholar |
|---|---|
| Author | Zhang, Xuhuai Davanço, Marcelo I. Maller, Kara Jarvis, Thomas W. Wu, Chihhui Fietz, Chris R. Korobkin, Dmitriy Li, Xiaoqin Elaine Shvets, G. Forrest, Stephen R. |
| Copyright Year | 2010 |
| Abstract | Negative phase advance through a single layer of near-IR negative index metamaterial (NIM) is identified through interferometric measurements. The NIM unit cell, sub-wavelength in both the lateral and light propagation directions, is comprised of a pair of Au strips separated by two dielectric and one Au film. Numerical simulations show that the negative phase advance through the single-layer sample is consistent with the negative index exhibited by a bulk material comprised of multiple layers of the same structure. We also numerically demonstrate that the negative index band persists in the lossless limit. |
| File Format | PDF HTM / HTML |
| DOI | 10.1364/OE.18.017788 |
| Alternate Webpage(s) | https://web2.ph.utexas.edu/~lilab/files/ZhangOX2010.pdf |
| PubMed reference number | 20721166 |
| Alternate Webpage(s) | https://doi.org/10.1364/OE.18.017788 |
| Journal | Medline |
| Volume Number | 18 |
| Issue Number | 17 |
| Journal | Optics express |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |