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A Digital Readout Technique for Capacitive Sensor Applications
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kung, Joseph Tze-Shew Lee, Hae-Seung Howe, Roger T. |
| Copyright Year | 1988 |
| Abstract | The difference between two capacitors is measured digitally using a charge redistribution techrdque incorporating a comparator, MOS switches, a successive approximation register (SAR), and a dlgital-to-anaIog converter (DAC). The technique is insensitive to comparator offset and parasitic capacitance, and the effect of MOS switch charge injection is measured and canceled. Extensive measurements have been made from test chips fabricated in 3-pm CMOS technology. Detection of percent dit’fereuces of less than 0.5 percent on 20100-fF capacitors has been successfully demonstrated. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www-mtl.mit.edu/wpmu/hslee/files/2005/02/0972kung.pdf |
| Alternate Webpage(s) | http://www-mtl.mit.edu/researchgroups/hslee/0972kung.pdf |
| Language | English |
| Access Restriction | Open |
| Subject Keyword | Analog Antifreeze Proteins CMOS Capacitive sensing Capacitor Device Component Charge-coupled device Coefficient Comparator Device Component Converter Device Component Digital signal processing Digital-to-analog converter Electric Capacitance Extravasation Hysteresis Image resolution Large Medical Device Incompatibility Problem Network switch Parasites Primary Myelofibrosis Spectral leakage Successive approximation ADC Switch Device Component voltage |
| Content Type | Text |
| Resource Type | Article |
