Loading...
Please wait, while we are loading the content...
Similar Documents
Synchrotron radiation photoelectron spectroscopy study of ITO surface
| Content Provider | Semantic Scholar |
|---|---|
| Author | Lai, Barry P. Ding, Xunmin Yuan, Zhi Lei Zhou, Xueyun Liao, Liangsheng Zhang, Shuyu Yuan, Shuai Hou, Xiaoyuan Xu, Pengshou Zhang, Xinyu |
| Copyright Year | 2000 |
| Abstract | Abstract Synchrotron radiation photoelectron spectroscopy (SRPES) has been applied to surface analysis of indium tin oxide (ITO) thin films. Several different components of In and Sn were observed at the clean ITO surface. By comparing the chemical compositions of the film before and after vacuum annealing, the contents of In 2 O 3− x and Sn 3 O 4 were found to be the major factors influencing the electrical conductivity and optical transparency of the film. |
| Starting Page | 35 |
| Ending Page | 38 |
| Page Count | 4 |
| File Format | PDF HTM / HTML |
| DOI | 10.1016/S0169-4332(99)00515-2 |
| Volume Number | 157 |
| Alternate Webpage(s) | http://www.physics.fudan.edu.cn/tps/people/xyhou/papers/04082410440002494.pdf |
| Alternate Webpage(s) | https://doi.org/10.1016/S0169-4332%2899%2900515-2 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |