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The impact of system configuration on device radiation damage testing of optical components
| Content Provider | Semantic Scholar |
|---|---|
| Author | Kniffan, S. D. Reed, R. A. Marshall, P. W. Howard, J. Kim, H.s. Schepis, J. P. |
| Copyright Year | 2003 |
| Abstract | We report on the significant impact that system configuration had on the radiation damage testing of a light emitting diode-phototransistor pair for the Hubble Space Telescope Wide Field/Planetary Camera 2. |
| Starting Page | 17 |
| Ending Page | 21 |
| Page Count | 5 |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://nepp.nasa.gov/DocUploads/B35E30E2-84A6-466A-B40E9F36577DC8BC/radecs03_A3_Kniffin.pdf |
| Journal | Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |