NDLI: Towards Sub-100 Nm X-ray Microscopy for Tomographic Applications

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Towards Sub-100 Nm X-ray Microscopy for Tomographic Applications

Content Provider	Semantic Scholar
Author	Bruyndonckx, Peter Sasov, A. Pauwels, Beate
Copyright Year	2009
Abstract	We aim to achieve a resolution below 100 nm in X-ray microscopy images for tomographic applications. The size of the X-ray focal spot is one of the important factors contributing to the attainable resolution in X-ray projection imaging. Especially for tomographic application, the use of X-ray focusing optics to overcome the influence of bigger focal spot sizes is not ideal due to the very small focusing depths they introduce. Contrast formation in the detector plane also depends on the absorption and phase contrast transfer functions [1] and hence object structures could be completely wiped out at spatial frequencies that otherwise wouldn’t suffer yet from the finite X-ray focal spot size.
File Format	PDF HTM / HTML
Alternate Webpage(s)	http://www.icdd.com/resources/axa/VOL53/V53_11.pdf
Alternate Webpage(s)	http://www.dxcicdd.com/09/PDF/Peter_Bruyndonckx.pdf
Alternate Webpage(s)	http://www.icdd.com/resources/axa/vol53/V53_11.pdf
Language	English
Access Restriction	Open
Subject Keyword	Biological specimen CDISC SEND Biospecimens Terminology Charge-coupled device Cleidocranial Dysplasia Computed Tomography Scanning Systems Copyright Degree (graph theory) Detectors Diagnostic radiologic examination Diameter (qualifier value) Diazooxonorleucine Eighty Nine Energy, Physics FOCAL (programming language) Field electron emission GNU nano Holder Device Component Image resolution Instrument - device International Standard Serial Number Mathematical optimization Microscopes, Electron, Scanning OLPC XO Pixel Size Radiation Radiography Schematic Schottky barrier Simulation X-Ray (Amazon Kindle) electron beam
Content Type	Text
Resource Type	Article

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