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Aberration Corrected High Angle Annular Dark Field (HAADF) Scanning Transmission Electron Microscopy (STEM) and In Situ Transmission Electron Microscopy (TEM) Study of Transition Metal Dichalcogenides (TMDs)
| Content Provider | Semantic Scholar |
|---|---|
| Author | Wang, Jingyu Lu, Ning Oviedo, Juan Pablo Peng, Xin Lian, Guoda Kim, Moon J. |
| Copyright Year | 2015 |
| Abstract | It is well documented that the dimensionality of materials plays a crucial role in determining their fundamental properties, in addition to the composition and arrangement of atoms. The most widely studied two-dimensional (2D) material to date is graphene, which exhibits exotic condensed-matter phenomena that are absent in bulk graphite [1]. Research in graphene and the methodology of preparing ultrathin layers has led to the exploration of other 2D materials [2]. In particular, single layers of transition metal dichalcogenides (TMDs) with lamellar structures similar to that of graphite have drawn significant attention because of their tunable bandgaps and abundance [2]. |
| Starting Page | 431 |
| Ending Page | 432 |
| Page Count | 2 |
| File Format | PDF HTM / HTML |
| DOI | 10.1017/S1431927615002950 |
| Volume Number | 21 |
| Alternate Webpage(s) | http://diyhpl.us/~nmz787/M&M%202015/7337/0431.pdf |
| Alternate Webpage(s) | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/D664323B07AB090423FE27ABA0C50931/S1431927615002950a.pdf/aberration_corrected_high_angle_annular_dark_field_haadf_scanning_transmission_electron_microscopy_stem_and_in_situ_transmission_electron_microscopy_tem_study_of_transition_metal_dichalcogenides_tmds.pdf |
| Alternate Webpage(s) | https://doi.org/10.1017/S1431927615002950 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
