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Elemental Profile Studies of Some Soil Samples Using Particle Induced X-Ray Emission (PIXE) Technique
| Content Provider | Semantic Scholar |
|---|---|
| Author | Akter, Shirin Ahasan, M. Monjur Abedin, Joynal Khatun, Rehana Monika, A. N. |
| Copyright Year | 2014 |
| Abstract | In this work Proton-Induced X-ray Emission (PIXE) technique has been employed for the determination of elemental concentration of soil samples. PIXE analyses have been carried out using a 2.5 MeV proton beam generated with the aid of the 3 MV tandem accelerator of the Institute Nuclear Science and Technology, Atomic Energy Research Establishment, Savar, Dhaka. The X-ray and particle spectra were processed using MAESTRO software and GUPIX software. The elements identified in the soil samples using PIXE were K: 6040.33, Ca: 2018.07, Ti: 3826.5, V: 188, Cr: 1472.22, Mn: 482.37, Fe: 33330.17, Co: 738.47, Ni: 480.95, Cu: 464.42 and Zn: 2144.93 ppm respectively. The legitimacy of the method was done by analyzing Standard Reference Material IAEA soil standard 2586 and found to be compatible. PIXE is a multi element systematic technique used for the determination of major, minor and trace elements in the range of parts per million (ppm). |
| Starting Page | 106 |
| Ending Page | 110 |
| Page Count | 5 |
| File Format | PDF HTM / HTML |
| Volume Number | 1 |
| Alternate Webpage(s) | http://publicationslist.org/data/ijrstp/ref-8/2.4%20IJRSTP.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
