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Field-induced cation migration in Cu oxide films by in situ scanning tunneling microscopy
| Content Provider | Semantic Scholar |
|---|---|
| Author | Singh, Jitendra Wang, G.-C. |
| Copyright Year | 2003 |
| Abstract | We observed the formation of Cu metallic nanoscale structures of ∼20-nm diameter and ∼2-nm height on a Cu2O covered polycrystalline Cu film under an applied field using a scanning tunneling microscope tip in a high vacuum condition. We interpreted the results as the Cu cation transport through the copper oxide film towards the surface when a positive biased voltage (>1.5 V) was applied to the film to lower the activation energy of the cation migration. Scanning tunneling spectroscopy measurements showed that the field-induced nanostructures were pure metallic Cu with a characteristic broad peak near −0.45 eV. No structural change was observed when a negative bias was applied to the film. |
| Starting Page | 4672 |
| Ending Page | 4674 |
| Page Count | 3 |
| File Format | PDF HTM / HTML |
| DOI | 10.1063/1.1586461 |
| Volume Number | 82 |
| Alternate Webpage(s) | http://homepages.rpi.edu/~wangg/publications/2003_2.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
