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Durability Evaluation of Hafnium Nitride Field Emitter Array
| Content Provider | Semantic Scholar |
|---|---|
| Author | Miyata, Yuko Kanzawa, Taro Gotoh, Yasuhito Tsuji, Hiroshi Ishikawa, Junzo |
| Copyright Year | 2008 |
| Abstract | Hafniun nitiride ˆeld emitter array (HfNFEA) was fabricated and the durability of HfNFEA was evaluated. As the durability evaluation, we operated HfNFEA in two diŠerent ways. One was long-time operation, and the other was the operation at elevated temperatures. HfNFEAs worked stably for 100 hours and could be operated at 100°C. It was shown that HfNFEA has a long life and capability of operation at high temperature. The insulating properties, however, became worse through these operations. |
| Starting Page | 162 |
| Ending Page | 164 |
| Page Count | 3 |
| File Format | PDF HTM / HTML |
| Volume Number | 51 |
| Alternate Webpage(s) | https://www.jstage.jst.go.jp/article/jvsj2/51/3/51_3_162/_pdf/-char/en |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
