NDLI: Application of atomic force microscopy to microbial surfaces: from reconstituted cell surface layers to living cells.

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Application of atomic force microscopy to microbial surfaces: from reconstituted cell surface layers to living cells.

Content Provider	Semantic Scholar
Author	Dufrêne, Yves F.
Copyright Year	2001
Abstract	The application of atomic force microscopy (AFM) to probe the ultrastructure and physical properties of microbial cell surfaces is reviewed. The unique capabilities of AFM can be summarized as follows: imaging surface topography with (sub)nanometer lateral resolution; examining biological specimens under physiological conditions; measuring local properties and interaction forces. AFM is being used increasingly for: (i) visualizing the surface ultrastructure of microbial cell surface layers, including bacterial S-layers, purple membranes, porin OmpF crystals and fungal rodlet layers; (ii) monitoring conformational changes of individual membrane proteins; (iii) examining the morphology of bacterial biofilms, (iv) revealing the nanoscale structure of living microbial cells, including fungi, yeasts and bacteria, (v) mapping interaction forces at microbial surfaces, such as van der Waals and electrostatic forces, solvation forces, and steric/bridging forces; and (vi) probing the local mechanical properties of cell surface layers and of single cells.
Starting Page	939
Ending Page	949
Page Count	11
File Format	PDF HTM / HTML
Alternate Webpage(s)	http://psi.cz/ftp/publications/others/david/Dufrene2001.pdf
PubMed reference number	10936459v1
Volume Number	32
Issue Number	2
Journal	Micron
Language	English
Access Restriction	Open
Subject Keyword	Fungi Membrane Proteins Microbial Biofilms Microscopy, Atomic Force Physical Phenomenon or Property Purple Membrane Specimen Yeasts anatomical layer
Content Type	Text
Resource Type	Article

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