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Recent progress with high-resolution FM profile reflectometer measurements on DIII-D *
| Content Provider | Semantic Scholar |
|---|---|
| Author | Zeng, Lingquan Wang, Guangjun Doyle, E. J. Peebles, W. A. Rhodes, T. L. |
| Copyright Year | 2005 |
| Abstract | Hardware and software advances continue to be incorporated in the high-resolution FM-CW density profile reflectometry system on DIII-D. A novel dual-polarization measurement technique was utilized, to expand the density coverage 0-6.4x10 m continuous, and with a time resolution of ≥10 μs and spatial resolution of ≥4 mm. The high memory-depth PC-based data-acquisition system has been expanded to 6 digitized channels. A new between-shot automatic profile analysis capability has recently been implemented, taking 4-5 minutes to automatically analyze X-mode profiles between discharges and storing profiles into the DIII-D MDSplus database. System capabilities are illustrated using results from a variety of areas such as L-H transition and pedestal physics, ELM dynamics, plasma-wall interaction studies, disruptions and ITB studies. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://www.aug.ipp.mpg.de/IRW/IRW7/papers/Zeng-paper.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
