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Characterization of X-ray Irradiated Graphene Oxide Coatings Using X-ray Diffraction, X-ray Photoelectron Spectroscopy, and Atomic Force Microscopy
| Content Provider | Semantic Scholar |
|---|---|
| Author | Blanton, Tom Majumdar, Debasis Brandt, Steve Fornalik, Jill |
| Copyright Year | 2012 |
| Abstract | Graphene oxide, GO, is generated by treating graphite with strong oxidizers. GO retains the layer structure of graphite but with a larger and irregular basal plane spacing. The name graphene oxide is not correct chemically. Besides oxygen epoxide groups, other functional groups observed to be present are carbonyl, phenol, and hydroxyl groups. It is the presence of the hydroxyl groups that allows GO to be dispersed in water. However, GO does not possess any of the electrical properties observed in graphene. Methods have been developed that convert GO to graphene but this transformed graphene retains defects seen in the original GO, resulting in a graphene that has a reduced conductivity and charge mobility compared to pristine graphene. |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | http://www.dxcicdd.com/12/abstracts/D-71.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
