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Evaluation of elastic modulus of ultra-thin vermiculite membranes by contact mode atomic force microscopy imaging
| Content Provider | Semantic Scholar |
|---|---|
| Author | Piner, Richard D. An, Jinho Ruoff, Rodney S. |
| Copyright Year | 2013 |
| Abstract | Abstract Mechanical properties of nanometer-thick multilayer vermiculite, a layered silicate, were investigated by atomic force microscopy (AFM) contact mode imaging. Membranes suspended over circular holes were with exfoliated vermiculite platelets. The elastic modulus and pre-stress of each membrane were obtained using AFM combined with finite element analysis. The exfoliated multilayer vermiculite membranes had an average in-plane elastic modulus and average pre-stress of 175 ± 16 GPa and 55 ± 13 MPa, respectively. |
| Starting Page | 205 |
| Ending Page | 209 |
| Page Count | 5 |
| File Format | PDF HTM / HTML |
| DOI | 10.1016/j.tsf.2012.12.024 |
| Alternate Webpage(s) | http://utw10193.utweb.utexas.edu/Archive/RuoffsPDFs/333.pdf |
| Alternate Webpage(s) | https://doi.org/10.1016/j.tsf.2012.12.024 |
| Volume Number | 527 |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |