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On-line accuracy assessment for the dual six-port ANA: Treatment of systematic errors
| Content Provider | Semantic Scholar |
|---|---|
| Author | Hoer, Cletus A. |
| Copyright Year | 1987 |
| Abstract | Expressions are derived for calculating estimates of the systematic errors in dual six-port or four-port measurements of reflection coefficient and scattering parameters due to imperfections in the transmission-line standard used to calibrate the system. A new mathematical model for a four-port reflectometer makes it easier to visualize and analyze these errors. In this new model, two of the three parameters needed to characterize a four-port can be determined without standards. All imperfections in the standard perturb only the third parameter which acts as an impedance transformer. |
| Starting Page | 514 |
| Ending Page | 519 |
| Page Count | 6 |
| File Format | PDF HTM / HTML |
| DOI | 10.1109/TIM.1987.6312730 |
| Volume Number | -36 |
| Alternate Webpage(s) | https://ia601506.us.archive.org/zipview.php?file=10.1109@tim.1987.6312730.pdf&zip=/3/items/ieee-us-government-works-dir/ieee-us-government-works-dir.zip |
| Alternate Webpage(s) | https://doi.org/10.1109/TIM.1987.6312730 |
| Journal | IEEE Transactions on Instrumentation and Measurement |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |
