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LS AFM Surface Potential Measurements Using Keysight 7500 AFM Application Brief
| Content Provider | Semantic Scholar |
|---|---|
| Copyright Year | 2014 |
| Abstract | where f is the contact potential difference (CPD) between the tip and the sample. It is evident from the Fv term in Equation (1) that Fv depends linearly on Vdc and becomes zero when Vdc = f. Therefore, SP can be measured directly by nullifying Fv. Since SP is measured here by nullifying the amplitude of the Fv, it is named AM-KFM, meaning amplitude sensitive. Alternatively, SP can be measured by nullifying the resonance frequency shift, ∆fv, caused by the ac modulation (FM-KFM), |
| File Format | PDF HTM / HTML |
| Alternate Webpage(s) | https://xdevs.com/doc/HP_Agilent_Keysight/5991-3183EN%20Surface%20Potential%20Measurements%20Using%20the%20Keysight%207500%20AFM%20-%20Application%20Note%20c20141020%20%5B4%5D.pdf |
| Language | English |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Article |